中文簡(jiǎn)介

ICDD的《季刊》（和一期特刊）國(guó)際期刊《粉末衍射》，著重于利用X射線粉末衍射和相關(guān)技術(shù)對(duì)材料進(jìn)行表征。該雜志的專題文章涵蓋了廣泛的應(yīng)用領(lǐng)域，從礦物分析到薄膜的外延生長(zhǎng)，到應(yīng)用軟件和硬件的進(jìn)步，提供了廣泛的實(shí)際應(yīng)用。ICDD與丹佛X射線會(huì)議組委會(huì)合作，為粉末衍射的訂戶和X射線分析進(jìn)展的作者增加了服務(wù)。從2006年開(kāi)始，ICDD向粉末衍射機(jī)構(gòu)用戶提供了一份上一年版AXA的復(fù)印件，這些用戶可以同時(shí)獲得打印版和在線版。這有效地使粉末衍射用戶每年可獲得的文章數(shù)量翻了一番，并顯著增加了作者在X射線分析進(jìn)展中的發(fā)行量。主題涵蓋：?X射線粉末衍射測(cè)量技術(shù)和程序?儀器進(jìn)展?包括有機(jī)材料、礦物、金屬和薄膜超導(dǎo)體在內(nèi)的材料研究?關(guān)于新材料作者、主題和頁(yè)碼的粉末數(shù)據(jù)發(fā)布在上一期內(nèi)容頁(yè)中。作者應(yīng)閱讀作者注釋，了解范圍、類別、手稿準(zhǔn)備和提交粉末衍射的信息。

投稿網(wǎng)址：http://www.icdd.com/websubmission/launch.html

英文簡(jiǎn)介

ICDD’s quarterly, (and a special topical issue) international journal, Powder Diffraction, focuses on materials characterization employing X-ray powder diffraction and related techniques. With feature articles covering a wide range of applications, from mineral analysis to epitactic growth of thin films to advances in application software and hardware, this journal offers a wide range of practical applications. ICDD, in collaboration with the Denver X-ray Conference Organizing Committee, has increased services for the subscribers of Powder Diffraction and authors of Advances in X-ray Analysis. Beginning in 2006, ICDD offered a copy of the previous year’s edition of AXA to Powder Diffraction institutional subscribers who receive both print and on-line versions. This effectively doubles the number of articles annually available to Powder Diffraction subscribers and significantly increases the circulation for the authors in Advances in X-ray Analysis. Subject coverage includes: ?Techniques and procedures in X-ray powder diffractometry ?Advances in instrumentation ?Study of materials including organic materials, minerals, metals and thin film superconductors ?Publication of powder data on new materials Authors, subjects and page numbers are listed in the past issue content pages. Authors should read Notes for Authors for information on the scope, categories, manuscript preparation and submission to Powder Diffraction.