中文簡(jiǎn)介

鼓勵(lì)作者提交新穎的材料，其最終目標(biāo)是提高以下方面的技術(shù)水平：測(cè)量和計(jì)量基礎(chǔ)、傳感器、測(cè)量?jī)x器、測(cè)量和估計(jì)技術(shù)、測(cè)量數(shù)據(jù)處理和融合算法；工廠和工業(yè)過(guò)程的評(píng)價(jià)程序和方法，系統(tǒng)、過(guò)程和算法的性能分析，面向測(cè)量目的的數(shù)學(xué)模型，連接世界的分布式測(cè)量系統(tǒng)。

投稿網(wǎng)址：http://ees.elsevier.com/meas/

英文簡(jiǎn)介

Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.