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您現(xiàn)在的位置是:首頁(yè)SCI期刊SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY(ACTA光譜化學(xué)B部分-原子光譜學(xué))
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY SCISCIE

ACTA光譜化學(xué)B部分-原子光譜學(xué)

0584-8547

物理

Monthly

No

SPECTROCHIM ACTA B

1967

147

ENGLAND

http://www.sciencedirect.com/science/journal/05848547

約2.0個(gè)月審稿時(shí)間

較易平均錄用比例

3.101影響因子

光譜學(xué)小學(xué)科

SCI三劍客

中文簡(jiǎn)介

光譜化學(xué)學(xué)報(bào)B部分:原子光譜學(xué),旨在快速出版的原始工作和評(píng)論在以下領(lǐng)域:原子發(fā)射光譜(AES)、原子吸收光譜(AAS)和原子熒光光譜(AFS);用于無(wú)機(jī)分析,包括火花源(SS-MS)、電感耦合等離子體(ICP-MS)、輝光放電(GD-MS)和二次離子質(zhì)譜(SIMS)。激光誘導(dǎo)原子光譜用于無(wú)機(jī)分析,包括非線性光學(xué)激光光譜、覆蓋激光增強(qiáng)電離(LEI)、激光誘導(dǎo)熒光(LIF)、共振電離光譜(RIS)和共振電離質(zhì)譜(RIMS);激光誘導(dǎo)擊穿光譜(LIBS);激光燒蝕電感耦合等離子體原子發(fā)射光譜(LA-ICP-AES)和激光燒蝕電感耦合等離子體質(zhì)譜(LA-ICP-MS)。X射線光譜法、X射線光學(xué)及顯微分析,包括X射線熒光光譜法(XRF)及相關(guān)技術(shù),特別是全反射X射線熒光光譜法(TXRF)、同步輻射激發(fā)全反射X射線光譜法(SR-TXRF)。涉及(i)基本原理、(ii)方法發(fā)展、(iii)儀器和(iv)應(yīng)用的手稿可提交出版。重點(diǎn)放在與“光譜化學(xué)分析”有關(guān)的論文上。主要科目將包括與產(chǎn)生原子或質(zhì)譜有關(guān)的物理和化學(xué)過(guò)程的理論或?qū)嶒?yàn)研究;原子數(shù)據(jù)的測(cè)定;光譜化學(xué)源診斷;在上述光譜分析領(lǐng)域中使用的完整儀器系統(tǒng)、儀器部件或設(shè)備的基本原理、設(shè)計(jì)或性能;定性和定量分析是指用一種方法或多種方法的組合完成分析程序,或部分完成程序:抽樣、制樣、進(jìn)樣、檢測(cè)、數(shù)據(jù)采集和處理(包括校準(zhǔn)和統(tǒng)計(jì)評(píng)價(jià));分析性能和優(yōu)點(diǎn)分析圖:檢測(cè)限和測(cè)定限、選擇性、精密度、準(zhǔn)確度、干擾。定期發(fā)表關(guān)于某一特別重要的主題或分析領(lǐng)域的權(quán)威和全面的評(píng)論文章。此外,歡迎就一個(gè)領(lǐng)域或?qū)n}的現(xiàn)況和未來(lái)前景作較短、簡(jiǎn)明的評(píng)論或觀點(diǎn),特別是與發(fā)展新的分析方法或更好地了解其基本基本原則有關(guān)的領(lǐng)域或?qū)n}。課程回顧,說(shuō)明了深入的基本概念在原子光譜和分析原子光譜,也發(fā)表了。描述光譜技術(shù)在分析中的應(yīng)用的文章也將被考慮。然而,在這種情況下,手稿的光譜味道應(yīng)該是實(shí)質(zhì)性的:不應(yīng)該只提交分析配方或強(qiáng)調(diào)分離和預(yù)濃縮技術(shù)的論文。最后,根據(jù)編輯的自由裁量權(quán),將考慮加快發(fā)表涉及新的重要概念、儀器發(fā)展或應(yīng)用的短篇論文。

http://ees.elsevier.com/sab/

英文簡(jiǎn)介

Spectrochimica Acta Part B-Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.The emphasis is on papers having a relationship with "spectrochemical analysis". The main subjects will include theoretical or experimental studies of the physical and chemical processes connected with the generation of atomic or mass spectra; the determination of atomic data; diagnostics for spectrochemical sources; the fundamentals, design or performance of complete instrumental systems, components of instruments, or devices used in any of the above stated fields of spectrometry; qualitative and quantitative analysis in the sense of complete analytical procedures using a single method or a combination of methods, or parts of complete procedures: sampling, sample preparation, sample introduction, detection, data acquisition and handling (including calibration and statistical evaluation); analytical performance and analytical figures of merit: limits of detection and limits of determination, selectivity, precision, accuracy, interferences.Authoritative and comprehensive review articles, dedicated to a particularly important topic or field of analysis, are published regularly. In addition, shorter, concise reviews or viewpoints focusing on the current status and future prospects of a field or topic particularly relevant to the development of a new analytical methodology or to a better understanding of its fundamental underlying principles are welcome. Tutorial reviews, illustrating in depth fundamental concepts in atomic spectroscopy and analytical atomic spectroscopy, are also published.Articles describing an application of a spectroscopic technique to analysis will also be considered. In this case, however, the spectroscopic flavor of the manuscript should be substantial: mere analytical recipes or papers emphasizing separation and pre-concentration techniques should not be submitted. Finally, to the editors' discretion, accelerated publication of short papers dealing with new important concepts, instrumental developments or applications will be considered.

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